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Dauletbekova, A., Alzhanova, A., Akylbekov, A., & Baubekova, G. (2018). X-ray Diffraction Investigation of Sio2/Si Track Templates with Deposited Zn. KnE Engineering, 3(5), 39–45. https://doi.org/10.18502/keg.v3i4.2223

https://doi.org/10.18502/keg.v3i4.2223

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authors

  • A Dauletbekova
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  • A Alzhanova
    No author data available.
  • A Akylbekov
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  • G Baubekova
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Published Date

  • May 7, 2018

X-ray Diffraction Investigation of Sio2/Si Track Templates with Deposited Zn

KnE Engineering / Russian Forum of Young Scientists (RFYS) / Pages 39–45

Abstract

Si/SiO2 /Zn structures are fabricated by the track template synthesis. SEM and AFM images of the surface after electrochemical deposition of zinc were obtained. XRD analysis of the deposited samples showed the creation of zinc oxide nanocrystals with Miller indexes (200) at θ=62,30 and (201) at θ=69,50 (PDF#361451-etalon).

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