X-ray Diffraction Investigation of Sio2/Si Track Templates with Deposited Zn
DOI:
https://doi.org/10.18502/keg.v3i4.2223Abstract
Si/SiO2 /Zn structures are fabricated by the track template synthesis. SEM and AFM images of the surface after electrochemical deposition of zinc were obtained. XRD analysis of the deposited samples showed the creation of zinc oxide nanocrystals with Miller indexes (200) at θ=62,30 and (201) at θ=69,50 (PDF#361451-etalon).
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