Bakerenkov AS, Glukhov NS, Shaltaeva YR, Rodin AS, Felitsyn VA. The Technique for I–V Characteristic Measurements of MOSFETs from Output Stage of MOS ICs. KEG [Internet]. 2018 Oct. 8 [cited 2025 Sep. 4];3(6):74–78. Available from: https://knepublishing.com/index.php/KnE-Engineering/article/view/2973