Bakerenkov, A S, N S Glukhov, Yu R Shaltaeva, A S Rodin, and V A Felitsyn. 2018. “The Technique for I–V Characteristic Measurements of MOSFETs from Output Stage of MOS ICs”. KnE Engineering 3 (6), 74–78. https://doi.org/10.18502/keg.v3i6.2973.