BAKERENKOV, A S; GLUKHOV, N S; SHALTAEVA, Yu R; RODIN, A S; FELITSYN, V A. The Technique for I–V Characteristic Measurements of MOSFETs from Output Stage of MOS ICs. KnE Engineering, [S. l.], v. 3, n. 6, p. 74–78, 2018. DOI: 10.18502/keg.v3i6.2973. Disponível em: https://knepublishing.com/index.php/KnE-Engineering/article/view/2973. Acesso em: 4 sep. 2025.