DAULETBEKOVA, A; ALZHANOVA, A; AKYLBEKOV, A; BAUBEKOVA, G. X-ray Diffraction Investigation of Sio2/Si Track Templates with Deposited Zn. KnE Engineering, [S. l.], v. 3, n. 5, p. 39–45, 2018. DOI: 10.18502/keg.v3i4.2223. Disponível em: https://knepublishing.com/index.php/KnE-Engineering/article/view/2223. Acesso em: 14 sep. 2025.