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Felitsyn, A. A. (2018). The Increase of the Lifetime of the Onboard Electronics of Spacecrafts By High-temperature Annealing of Radiation Defects. KnE Engineering, 3(6), 100–102. https://doi.org/10.18502/keg.v3i6.2979

https://doi.org/10.18502/keg.v3i6.2979

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  • A A Felitsyn
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Published Date

  • Oct 8, 2018

The Increase of the Lifetime of the Onboard Electronics of Spacecrafts By High-temperature Annealing of Radiation Defects

KnE Engineering / Breakthrough directions of scientific research at MEPhI: Development prospects within the Strategic Academic Units / Pages 100–102

Abstract

The technique for increasing the maximum lifetime of the electronic equipment for space applications was developed. The technique is based on controlled temperature annealing of radiation defects accumulated in integrated microcircuits under the impact of ionizing radiations of space environment.

References
[1] Pershenkov, V. S., Popov, V. D., and Shalnov, A. V. (1988). Surface radiation effects
in elements of integrated microcircuits. M: Energoatomizdat.