MAVRITSKII, O; CHUMAKOV, A; EGOROV, A; PECHENKIN, A; SAVCHENKOV, D. The Laser-only Single-event Effects Test Method for Spacecraft Electronics Based on Ultrashort-pulsed-laser Local Irradiation. KnE Energy, [S. l.], v. 3, n. 3, p. 317–326, 2018. DOI: 10.18502/ken.v3i3.2044. Disponível em: https://knepublishing.com/index.php/KnE-Energy/article/view/2044. Acesso em: 2 jul. 2025.